X-ray spectrometry : recent technological advances /

X-ray spectrometry : recent technological advances /

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Bibliographic Details
Imprint:	Chichester, West Sussex, England ; Hoboken, NJ, USA : John Wiley, c2004.
Description:	xii, 603 p. : ill. ; 26 cm.
Language:	English
Subject:	X-ray spectroscopy. Chemistry Techniques, Analytical. Spectrometry, X-Ray Emission -- instrumentation. Spectrometry, X-Ray Emission -- methods. X-ray spectroscopy.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/5157948

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Other authors / contributors:	Tsuji, Kouichi. Injuk, Jasna. Grieken, R. van (René)
ISBN:	047148640X (Hbk. : alk. paper)
Notes:	Includes bibliographical references and index.

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Call Number:	QD96.X2 X28 2004
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