Introduction to focused ion beams : instrumentation, theory, techniques, and practice /
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| Imprint: | New York : Springer Science, c2005. |
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| Description: | xiv, 357 p. : ill. ; 25 cm. |
| Language: | English |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/5623880 |
Crerar, Lower Level, Bookstacks
| Call Number: |
QC702.7.B65 I63 2005
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| c.1 | Available Loan period: standard loan Scan and Deliver Request for Pickup Need help? - Ask a Librarian |
