Introduction to focused ion beams : instrumentation, theory, techniques, and practice /
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| Imprint: | New York : Springer Science, c2005. |
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| Description: | xiv, 357 p. : ill. ; 25 cm. |
| Language: | English |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/5623880 |
| Summary: | Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. |
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| Physical Description: | xiv, 357 p. : ill. ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0387231161 038723313X |
