International Symposium on Quality of Electronic Design [proceedings].

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Bibliographic Details
Meeting name:	International Symposium on Quality Electronic Design.
Imprint:	Los Alamitos, Calif. : IEEE Computer Society, 2000-
Language:	English
Subject:	Integrated circuits -- Very large scale integration -- Design and construction -- Congresses. Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses. Integrated circuits industry -- Quality control -- Congresses. Integrated circuits industry -- Quality control. Integrated circuits -- Very large scale integration -- Computer-aided design. Integrated circuits -- Very large scale integration -- Design and construction. Conference papers and proceedings.
Format:	E-Resource Journal
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/5672649

Hidden Bibliographic Details
Varying Form of Title:	International Symposium on Quality of Electronic Design Issues for 2nd (2001)-6th (2005) have title: International Symposium on Quality Electronic Design Symposium on Quality of Electronic Design Symposium on Quality Electronic Design Quality of Electronic Design Quality Electronic Design IEEE ISQED ISQED
Other authors / contributors:	IEEE Computer Society. Technical Committee on VLSI. IEEE Computer Society. Design Automation Technical Committee.
Date / volume:	1st (2000)-
Notes:	Title from volume table of contents page (IEEE Web site, viewed on Jul. 26, 2005). Latest issue consulted: 6th (2005). Also issued in print. Mode of access: World Wide Web. Sponsored by: IEEE Computer Society; Technical Committees on VLSI and Design Automation.
Other form:	International Symposium on Quality Electronic Design. Proceedings

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