Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications /

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Bibliographic Details
Author / Creator:Rein, S. (Stefan)
Imprint:Berlin ; New York : Springer, c2005.
Description:xxvi, 489 p. : ill. (some col.) ; 25 cm.
Language:English
Series:Springer series in materials science, 0933-033X ; 85
Springer series in materials science ; v. 85.
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/5928644
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ISBN:3540253033
Notes:Includes bibliographical references and index.
Standard no.:9783540253037