Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications /
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| Author / Creator: | Rein, S. (Stefan) |
|---|---|
| Imprint: | Berlin ; New York : Springer, c2005. |
| Description: | xxvi, 489 p. : ill. (some col.) ; 25 cm. |
| Language: | English |
| Series: | Springer series in materials science, 0933-033X ; 85 Springer series in materials science ; v. 85. |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/5928644 |
