Introduction to scanning tunneling microscopy /

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Bibliographic Details
Author / Creator:Chen, C. Julian.
Edition:2nd ed.
Imprint:Oxford ; New York : Oxford University Press, 2008.
Description:lxiii, 423 p. : ill. ; 24 cm.
Language:English
Series:Monographs on the physics and chemistry of materials ; 64
Monographs on the physics and chemistry of materials ; 64.
Subject:
Format: E-Resource Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/6660318
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ISBN:9780199211500 (alk. paper)
0199211507 (alk. paper)
Notes:Includes bibliographical references (p. [401]-418) and index.
Summary:The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. This is a thoroughly updated version of this 'bible' in the field.
Other form:Online version: Chen, C. Julian. Introduction to scanning tunneling microscopy. 2nd ed. Oxford ; New York : Oxford University Press, 2008

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Call Number: QH212.S35 C44 2008
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