Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA.

Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA.

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Bibliographic Details
Imprint:	Warrendale, PA : Materials Research Society, c2006.
Description:	106 p. : ill. ; 24 cm.
Language:	English
Series:	Materials Research Society symposium proceedings ; v. 983 Materials Research Society symposia proceedings ; v. 983.
Subject:	Focused ion beams -- Congresses. Focused ion beams. Conference papers and proceedings.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/6696232

Hidden Bibliographic Details
Other authors / contributors:	Materials Research Society. Meeting (2006 : Boston, Mass.)
ISBN:	9781604234305 160423430X
Notes:	"Fall 2006." Includes bibliographical references and index.

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Call Number:	QC702.7.B65 F63 2006
c.1	Available Loan period: standard loan Scan and Deliver Request for Pickup Need help? - Ask a Librarian