Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA.

Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA.

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Bibliographic Details
Imprint:Warrendale, PA : Materials Research Society, c2006.
Description:106 p. : ill. ; 24 cm.
Language:English
Series:Materials Research Society symposium proceedings ; v. 983
Materials Research Society symposia proceedings ; v. 983.
Subject:
Focused ion beams -- Congresses.
Focused ion beams.
Conference papers and proceedings.
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/6696232
Hidden Bibliographic Details
Other authors / contributors:Materials Research Society. Meeting (2006 : Boston, Mass.)
ISBN:9781604234305
160423430X
Notes:"Fall 2006."
Includes bibliographical references and index.

Proceedings of a meeting held 27 November - 1 December 2006, Boston, Massachusetts. Symposium LL at the 2006 MRS Fall Meeting. Excerpted from Focused Ion Beams for Analysis and Processing All rights reserved by the original copyright owners. Excerpts are provided for display purposes only and may not be reproduced, reprinted or distributed without the written permission of the publisher.

Purchased from The Ed & Martha Vanderwicken Book Fund bookplate
The John Crerar Library bookplate

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