Unequal by design : high-stakes testing and the standardization of inequality /

Unequal by design : high-stakes testing and the standardization of inequality /

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Bibliographic Details
Author / Creator:	Au, Wayne, 1972-
Imprint:	New York : Routledge, 2009.
Description:	xii, 199 p. ; 23 cm.
Language:	English
Series:	The critical social thought series Critical social thought.
Subject:	Educational tests and measurements -- Social aspects -- United States. Test bias -- United States. Educational equalization -- United States. Educational equalization. Educational tests and measurements -- Social aspects. Test bias. United States.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/7363304

Hidden Bibliographic Details
ISBN:	9780415990707 (hb : alk. paper) 041599070X (hb : alk. paper) 9780415990714 (pb : alk. paper) 0415990718 (pb : alk. paper) 9780203892046 (ebook) 0203892046 (ebook)
Notes:	Includes bibliographical references (p. 163-189) and index.

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Holdings details from Regenstein, Bookstacks
Call Number:	LB3051 .A86 2009
c.1	Available Loan period: standard loan Scan and Deliver Request for Pickup Need help? - Ask a Librarian