Focused ion beams for materials characterization and micromachining : March 24-28, 2008, San Francisco, California, USA.

Focused ion beams for materials characterization and micromachining : March 24-28, 2008, San Francisco, California, USA.

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Bibliographic Details
Imprint:	Warrendale, PA : Materials Research Society, c2008.
Description:	23 p. : ill. ; 24 cm.
Language:	English
Series:	Materials Research Society symposium proceedings ; v. 1089 Materials Research Society symposia proceedings ; v. 1089.
Subject:	Focused ion beams -- Industrial applications -- Congresses. Micromachining -- Materials -- Congresses. Conference papers and proceedings.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/7793442

Hidden Bibliographic Details
Other authors / contributors:	Materials Research Society. Meeting (2008 : San Francisco, Calif.)
ISBN:	1605608769 9781605608761
Notes:	"Spring 2008."--Cover. "Printed from e-media with permission by: Curran Associates, Inc." Includes bibliographical references and index.

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Call Number:	QC702.7.B65 F64 2008
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