Computed tomography : principles, design, artifacts, and recent advances /

Computed tomography : principles, design, artifacts, and recent advances /

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Bibliographic Details
Author / Creator:	Hsieh, Jiang.
Edition:	2nd ed.
Imprint:	Bellingham, Wash. : SPIE ; Hoboken, N.J. : J. Wiley & Sons, c2009.
Description:	xiv, 556 p. : ill. ; 26 cm.
Language:	English
Subject:	Tomography. Tomography, X-Ray Computed. Tomography Scanners, X-Ray Computed -- trends. Tomography, X-Ray Computed -- instrumentation. Tomography, X-Ray Computed -- trends. Tomography.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/7907102

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Other authors / contributors:	SPIE (Society)
ISBN:	9780470563533 0470563532 9780819475336 0819475335
Notes:	Includes bibliographical references and index.

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Call Number:	RC78.7.T6 H757 2009
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