X-ray calibration : techniques, sources, and detectors /

X-ray calibration : techniques, sources, and detectors /

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Bibliographic Details
Imprint:	Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986.
Description:	vi, 254 p. : ill. ; 28 cm.
Language:	English
Series:	Proceedings of SPIE--the International Society for Optical Engineering v. 689
Subject:	Scientific apparatus and instruments -- Calibration -- Congresses. X-rays -- Congresses. Scientific apparatus and instruments -- Calibration. X-rays. Conference papers and proceedings.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/801963

Hidden Bibliographic Details
Other authors / contributors:	Rockett, Paul D. Lee, Ping University of Rochester. Institute of Optics
ISBN:	0892527242 (pbk.)
Notes:	"[Meeting held] 19-20 August 1986, San Diego, California." Includes bibliographies and index.

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Call Number:	Q184.X730 1986
c.1	Available Loan period: standard loan Request from Mansueto Scan and Deliver Need help? - Ask a Librarian