X-ray calibration : techniques, sources, and detectors /
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| Imprint: | Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986. |
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| Description: | vi, 254 p. : ill. ; 28 cm. |
| Language: | English |
| Series: | Proceedings of SPIE--the International Society for Optical Engineering v. 689 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/801963 |
| Item Description: | "[Meeting held] 19-20 August 1986, San Diego, California." |
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| Physical Description: | vi, 254 p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographies and index. |
| ISBN: | 0892527242 |
