X-ray calibration : techniques, sources, and detectors /

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Bibliographic Details
Imprint:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986.
Description:vi, 254 p. : ill. ; 28 cm.
Language:English
Series:Proceedings of SPIE--the International Society for Optical Engineering v. 689
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/801963
Hidden Bibliographic Details
Other authors / contributors:Rockett, Paul D.
Lee, Ping
University of Rochester. Institute of Optics
ISBN:0892527242 (pbk.)
Notes:"[Meeting held] 19-20 August 1986, San Diego, California."
Includes bibliographies and index.

MARC

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