Electromigration on semiconductor integrated circuits.

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Bibliographic Details
Imprint:Washington, DC : U.S. Nuclear Regulatory Commission, Office of Nuclear Reactror Regulation, [2002]
Description:1 online resource (2 p.).
Language:English
Series:NRC information notice ; 2002-32
NRC information notice ; 2002-32.
Subject:
Format: E-Resource U.S. Federal Government Document Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8270027
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Other authors / contributors:U.S. Nuclear Regulatory Commission. Office of Nuclear Reactor Regulation.
Notes:Title from PDF title screen (viewed on Sept. 29, 2010).
"October 31, 2002."
"ML023080088."
GPO item no.:1051-H-08 (online)
Govt.docs classification:Y 3.N 88:56-2/2002-32