Layout design and verification /

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Bibliographic Details
Imprint:Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
Description:ix, 356 p. : ill. ; 25 cm.
Language:English
Series:Advances in CAD for VLSI v. 4
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/833080
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Other authors / contributors:Ohtsuki, T. (Tatsuo), 1940-
ISBN:0444878947 (Elsevier Science Pub. Co.)
Notes:Includes bibliographies and indexes.