Capacitance cell measurement of the out-of-plane expansion of thin films /

Capacitance cell measurement of the out-of-plane expansion of thin films /

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Bibliographic Details
Author / Creator:Snyder, Chad R.
Imprint:[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001]
Description:1 online resource (x, 32 pages) : illustrations.
Language:English
Series:NIST special publication ; no. 960-7
NIST recommended practice guide
NIST recommended practice guide.
NIST special publication ; no. 960-7.
Subject:
Thin-film circuits.
Thin films -- Thermal properties.
Expansion (Heat) -- Measurement.
Format: E-Resource U.S. Federal Government Document Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8375883
Hidden Bibliographic Details
Other authors / contributors:Mopsik, F. I.
National Institute of Standards and Technology (U.S.)
Notes:Title from title screen (viewed Apr. 19, 2011).
"November 2001."
"CODEN: NSPUE2."
Includes bibliographical references (pages 31-32).
Other form:Paper version: Snyder, Chad R. Capacitance cell measurement of the out-of-plane expansion of thin films.
GPO item no.:0247 (online)
Govt.docs classification:C 13.10:960-7

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