Contamination and ESD control in high technology manufacturing /

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Bibliographic Details
Author / Creator:Welker, R. W.
Imprint:Hoboken, N.J. : John Wiley & Sons : IEEE Press, c2006.
Description:1 online resource (xvi, 498 p.) : ill.
Language:English
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8680128
Hidden Bibliographic Details
Other authors / contributors:Nagarajan, R. (Ramamurthy)
Newberg, Carl E.
John Wiley & Sons.
ISBN:0471414522 (hbk.)
9780471414520 (hbk.)
0470007788 (eBook)
9780470007785 (eBook)
Notes:Includes bibliographical references and index.
Summary:"This book offers effective strategies and techniques for contamination and electrostatic discharge (ESD) control that can be implemented in a wide range of high-technology industries, including semiconductor, disk drive, aerospace, pharmaceutical, medical device, automobile, and food production manufacturing. The authors set forth a new and innovative methodology that can manage both contamination and ESD, often considered to be mutually exclusive challenges requiring distinct strategies." "Contamination and ESD Control in High-Technology Manufacturing conveys a practical, working knowledge of contamination and ESD control strategies and techniques, and it is filled with case studies that illustrate key principles and the benefits of contamination and ESD control. Moreover, its straightforward style makes the material, which integrates many disciplines of engineering and science, clear and accessible."--Jacket.
Other form:Print version: Welker, R. W. Contamination and ESD control in high technology manufacturing. Hoboken, N.J. : John Wiley & Sons : IEEE Press, c2006 0471414522
Standard no.:10.1002/0470007788