Digital systems testing and testable design /

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Bibliographic Details
Author / Creator:	Abramovici, Miron.
Imprint:	New York, NY : Computer Science Press, c1990.
Description:	1 online resource (xxi, 653 p.) : ill.
Language:	English
Series:	Electrical engineering, communications, and signal processing Electrical engineering communications and signal processing series.
Subject:	Digital integrated circuits -- Testing. Digital integrated circuits -- Design and construction. Digital integrated circuits -- Testing. Digital integrated circuits -- Design and construction.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/8680235

Hidden Bibliographic Details
Other authors / contributors:	Breuer, Melvin A. Friedman, Arthur D.
ISBN:	9780470544389 0470544384
Notes:	Includes bibliographical references (p. 644-645) and index. Description based on print version record.
Other form:	Print version: Abramovici, Miron. Digital systems testing and testable design. New York, NY : Computer Science Press, c1990 0716781794 9780716781790

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