Process variations and probabilistic integrated circuit design /

Process variations and probabilistic integrated circuit design /

Saved in:
Bibliographic Details
Imprint:New York, NY : Springer, c2012.
Description:1 online resource (xvi, 249 p.)
Language:English
Subject:
Integrated circuits -- Design and construction.
Integrated circuits -- Computer-aided design.
Integrated circuits -- Computer-aided design.
Integrated circuits -- Design and construction.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8871970
Hidden Bibliographic Details
Other authors / contributors:Dietrich, Manfred.
Haase, Joachim.
ISBN:9781441966216 (electronic bk.)
1441966218 (electronic bk.)
9781441966209
Notes:Includes bibliographical references and index.

Similar Items