Modeling nanoscale imaging in electron microscopy /

Modeling nanoscale imaging in electron microscopy /

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Bibliographic Details
Imprint:New York : Springer, c2012.
Description:1 online resource (ix, 182 p.) : ill.
Language:English
Series:Nanostructure science and technology, 1571-5744
Nanostructure science and technology.
Subject:
Scanning transmission electron microscopy -- Simulation methods.
Image analysis.
Image analysis.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8873205
Hidden Bibliographic Details
Other authors / contributors:Vogt, Thomas.
Dahmen, Wolfgang, 1949-
Binev, Peter.
ISBN:9781461421917 (electronic bk.)
1461421918 (electronic bk.)
9781461421900
Notes:Includes bibliographical references and index.

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