Fundamentals of nanoscale film analysis /

Fundamentals of nanoscale film analysis /

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Bibliographic Details
Author / Creator:Alford, Terry L.
Imprint:New York, N.Y. ; London : Springer, c2007.
Description:1 online resource (xiv, 336 p.) : ill.
Language:English
Subject:
Thin films.
Nanostructured materials.
Nanostructured materials.
Thin films.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8880926
Hidden Bibliographic Details
Other authors / contributors:Feldman, Leonard C.
Mayer, James W., 1930-
ISBN:9780387292601 (hbk.)
0387292608 (hbk.)
0387292616 (e-book)
9780387292618 (e-book)
9786611350451
6611350454
Notes:Includes bibliographical references and index.
Other form:Print version: Alford, Terry L. Fundamentals of nanoscale film analysis. New York, N.Y. ; London : Springer, c2007 9780387292601 0387292608

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