Emerging nanotechnologies : test, defect tolerance, and reliability /

Emerging nanotechnologies : test, defect tolerance, and reliability /

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Bibliographic Details
Imprint:New York : Springer Verlag, c2008.
Description:1 online resource (xii, 405 p.) : ill.
Language:English
Series:Frontiers in electronic testing ; 37
Frontiers in electronic testing ; 37.
Subject:
Nanotechnology.
Microtechnology.
Microtechnology.
Nanotechnology.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8884865
Hidden Bibliographic Details
Other authors / contributors:Tehranipoor, Mohammad H., 1974-
ISBN:9780387747477
0387747478
9780387747460
038774746X
9786611140168
6611140166
9781615833795 (electronic bk.)
161583379X (electronic bk.)
Notes:Includes bibliographical references and index.
Description based on print version record.
Other form:Print version: Emerging nanotechnologies. New York : Springer Verlag, c2008 9780387747460 038774746X

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