Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations /

Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations /

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Bibliographic Details
Author / Creator:Garg, Rajesh.
Imprint:New York : Springer, c2010.
Description:1 online resource (xxiii, 212 p.) : ill.
Language:English
Subject:
Integrated circuits -- Very large scale integration.
Integrated circuits -- Very large scale integration.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8894096
Hidden Bibliographic Details
Other authors / contributors:Khatri, Sunil P., 1965-
ISBN:9781441909312 (e-isbn)
1441909311 (e-isbn)
9781441909305
1441909303
Notes:Includes bibliographical references and index.
Description based on print version record.
Other form:Print version: Garg, Rajesh. Analysis and design of resilient VLSI circuits. New York ; London : Springer, c2010 9781441909305

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