Applied nonparametric statistics in reliability /

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Bibliographic Details
Imprint:London ; New York : Springer, c2011.
Description:1 online resource (xiii, 230 p.)
Language:English
Series:Springer series in reliability engineering
Springer Series in Reliability Engineering.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8897536
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Other authors / contributors:Gámiz, M. Luz.
ISBN:9780857291189 (electronic bk.)
0857291181 (electronic bk.)
9780857291172
Notes:Includes bibliographical references and index.
Description based on print version record.