Atomic scale characterization and first-principles studies of Si₃N₄ interfaces /

Atomic scale characterization and first-principles studies of Si₃N₄ interfaces /

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Bibliographic Details
Author / Creator:Walkosz, Weronika.
Imprint:New York : Springer, c2011.
Description:1 online resource (xiii, 108 p.) : ill.
Language:English
Series:Springer theses
Springer theses.
Subject:
Interfaces (Physical sciences)
Condensed matter.
Condensed matter.
Interfaces (Physical sciences)
Format: E-Resource Dissertations Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8898055
Hidden Bibliographic Details
ISBN:9781441978172 (electronic bk.)
1441978178 (electronic bk.)
9781441978165
144197816X
Notes:Thesis--University of Illinois.
Includes bibliographical references and index.
Description based on print version record.
Other form:Atomic Scale Characterization and First-principles Studies of Silicon Nitride Interfaces. Springer Verlag 2011 9781441978165

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