Atomic scale characterization and first-principles studies of Si₃N₄ interfaces /
Saved in:
| Author / Creator: | Walkosz, Weronika. |
|---|---|
| Imprint: | New York : Springer, c2011. |
| Description: | 1 online resource (xiii, 108 p.) : ill. |
| Language: | English |
| Series: | Springer theses Springer theses. |
| Subject: | |
| Format: | E-Resource Dissertations Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/8898055 |
MARC
| LEADER | 00000cam a2200000Ka 4500 | ||
|---|---|---|---|
| 001 | 8898055 | ||
| 003 | ICU | ||
| 005 | 20120829152000.0 | ||
| 006 | m d | ||
| 007 | cr cn| | ||
| 008 | 110602s2011 nyua obm 001 0 eng d | ||
| 016 | 7 | |a 015679245 |2 Uk | |
| 019 | |a 716268831 |a 726693275 | ||
| 020 | |a 9781441978172 (electronic bk.) | ||
| 020 | |a 1441978178 (electronic bk.) | ||
| 020 | |z 9781441978165 | ||
| 020 | |z 144197816X | ||
| 035 | |a (OCoLC)728101763 |z (OCoLC)716268831 |z (OCoLC)726693275 | ||
| 037 | |a 978-1-4419-7816-5 |b Springer |n http://www.springerlink.com | ||
| 040 | |a GW5XE |b eng |c GW5XE |d OCLCQ |d CUS |d UKMGB |d SNK |d RRP | ||
| 049 | |a CGUA | ||
| 082 | 0 | 4 | |a 541/.33 |2 22 |
| 090 | |a QC173.4.I57 |b W35 2011 | ||
| 100 | 1 | |a Walkosz, Weronika. |0 http://id.loc.gov/authorities/names/n2016027807 |1 http://viaf.org/viaf/308288455 | |
| 245 | 1 | 0 | |a Atomic scale characterization and first-principles studies of Si₃N₄ interfaces / |c Weronika Walkosz. |
| 260 | |a New York : |b Springer, |c c2011. | ||
| 300 | |a 1 online resource (xiii, 108 p.) : |b ill. | ||
| 336 | |a text |b txt |2 rdacontent |0 http://id.loc.gov/vocabulary/contentTypes/txt | ||
| 337 | |a computer |b c |2 rdamedia |0 http://id.loc.gov/vocabulary/mediaTypes/c | ||
| 338 | |a online resource |b cr |2 rdacarrier |0 http://id.loc.gov/vocabulary/carriers/cr | ||
| 490 | 1 | |a Springer theses | |
| 502 | |a Thesis--University of Illinois. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 588 | |a Description based on print version record. | ||
| 650 | 0 | |a Interfaces (Physical sciences) |0 http://id.loc.gov/authorities/subjects/sh94006577 | |
| 650 | 0 | |a Condensed matter. |0 http://id.loc.gov/authorities/subjects/sh85030765 | |
| 655 | 4 | |a Electronic books. | |
| 650 | 7 | |a Condensed matter. |2 fast |0 http://id.worldcat.org/fast/fst00874443 | |
| 650 | 7 | |a Interfaces (Physical sciences) |2 fast |0 http://id.worldcat.org/fast/fst00976205 | |
| 776 | 0 | 8 | |t Atomic Scale Characterization and First-principles Studies of Silicon Nitride Interfaces. |d Springer Verlag 2011 |z 9781441978165 |w (OCoLC)668191391 |
| 856 | 4 | 0 | |u http://dx.doi.org/10.1007/978-1-4419-7817-2 |y SpringerLink |
| 830 | 0 | |a Springer theses. |0 http://id.loc.gov/authorities/names/no2010186160 | |
| 903 | |a HeVa | ||
| 035 | |a (ICU)8898055 | ||
| 929 | |a eresource | ||
| 999 | f | f | |i fb2beed1-2236-5a51-93ea-1c3626fdc2df |s 0cd88b57-317a-574f-a0d8-a9e20a2253fc |
| 928 | |t Library of Congress classification |a QC173.4.I57 W35 2011 |l Online |c UC-FullText |u http://dx.doi.org/10.1007/978-1-4419-7817-2 |z SpringerLink |g ebooks |i 11484035 | ||