Signal measurement and estimation techniques for micro and nanotechnology /
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Imprint: | New York : Springer, 2011. |
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Description: | 1 online resource (x, 242 p.) : ill. (some col.) |
Language: | English |
Subject: | |
Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/8899993 |