Pattern recognition, machine intelligence and biometrics /

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Bibliographic Details
Imprint:Beijing : Higher Education Press ; Berlin ; New York : Springer, c2011.
Description:1 online resource (xxxix, 866 p.) : ill.
Language:English
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8900514
Hidden Bibliographic Details
Other authors / contributors:Wang, Patrick S-P. (Patrick Shen-pei)
ISBN:9783642224072 (electronic bk.)
3642224075 (electronic bk.)
9787040331394
704033139X
9783642224065
3642224067
Notes:Includes bibliographical references and index.
Description based on print version record.
Other form:Print version: Pattern recognition, machine intelligence and biometrics. Beijing : Higher Education Press ; Dordrecht ; New York : Springer, 2011 9787040331394