Photomodulated optical reflectance : a fundamental study aimed at non-destructive carrier profiling in silicon /

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Bibliographic Details
Author / Creator:	Bogdanowicz, Janusz.
Imprint:	Berlin ; New York : Springer, c2012.
Description:	1 online resource.
Language:	English
Series:	Springer Theses, 2190-5053 Springer theses.
Subject:	Semiconductors -- Testing -- Optical methods. Silicon -- Optical properties. Silicon -- Nondestructive testing. Semiconductors -- Testing -- Optical methods. Silicon -- Optical properties.
Format:	E-Resource Dissertations Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/8900806

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ISBN:	9783642301087 (electronic bk.) 3642301088 (electronic bk.) 9783642301070
Notes:	"Doctoral thesis accepted by the University of Leuven, Belgium."--T.p. Thesis (PhD.)-- University of Leuven. Includes bibliographical references.

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