Atom probe microscopy /

Saved in:

Bibliographic Details
Imprint:	New York : Springer, c2012.
Description:	1 online resource (xxiii, 396 p.) : ill. (some col.).
Language:	English
Series:	Springer series in materials science ; 160 Springer series in materials science ; 160.
Subject:	Atomic force microscopy. Scanning probe microscopy. Atom-probe field ion microscopy. Atom-probe field ion microscopy. Atomic force microscopy. Scanning probe microscopy.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/8910085

Hidden Bibliographic Details
Other authors / contributors:	Gault, Baptiste.
ISBN:	9781461434368 (electronic bk.) 146143436X (electronic bk.) 9781461434351 1461434351
Notes:	Includes bibliographical references and index. Description based on print version record.
Other form:	Print version: Atom probe microscopy. New York : Springer, c2012 9781461434351

Similar Items