Proceedings of the XII International Symposium on Electron Beam Ion Sources and Traps : East Lansing, Michigan, USA, 18-21 May 2014 /

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Bibliographic Details
Meeting name:International Symposium on Electron Beam Ion Sources and Traps (12th : 2014 : East Lansing, Mich.)
Imprint:Melville, New York : AIP Publishing, 2015.
Description:1 online resource (v, 160 pages) : illustrations (some color).
Language:English
Series:AIP proceedings, 0094-243X ; volume 1640
AIP conference proceedings ; no. 1640.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/10118988
Hidden Bibliographic Details
Varying Form of Title:XII International Symposium on Electron Beam Ion Sources and Traps
12th International Symposium on Electron Beam Ion Sources and Traps
Twelfth International Symposium on Electron Beam Ion Sources and Traps
Electron Beam Ion Sources and Traps
Other authors / contributors:Lapierre, Alain. National Superconducting Cyclotron Laboratory, Michigan State University, Michigan, USA, editor.
Schwarz, Stefan. National Superconducting Cyclotron Laboratory, Michigan State University, Michigan, USA, editor.
Baumann, Thomas M. National Superconducting Cyclotron Laboratory, Michigan State University, Michigan, USA, editor.
ISBN:9780735412798
0735412790
Digital file characteristics:text file PDF
Notes:"Conference collection."
"All papers have been peer reviewed."
Includes bibliographical references.
Online resource; title from PDF title page (AIP/Scitation Web site, viewed January 16, 2015).