Proceedings of the XII International Symposium on Electron Beam Ion Sources and Traps : East Lansing, Michigan, USA, 18-21 May 2014 /
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Meeting name: | International Symposium on Electron Beam Ion Sources and Traps (12th : 2014 : East Lansing, Mich.) |
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Imprint: | Melville, New York : AIP Publishing, 2015. |
Description: | 1 online resource (v, 160 pages) : illustrations (some color). |
Language: | English |
Series: | AIP proceedings, 0094-243X ; volume 1640 AIP conference proceedings ; no. 1640. |
Subject: | |
Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/10118988 |