Modeling nanoscale imaging in electron microscopy /
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| Imprint: | New York : Springer, c2012. |
|---|---|
| Description: | 1 online resource (ix, 182 p.) : ill. |
| Language: | English |
| Series: | Nanostructure science and technology, 1571-5744 Nanostructure science and technology. |
| Subject: | |
| Format: | E-Resource Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/8873205 |
MARC
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| 245 | 0 | 0 | |a Modeling nanoscale imaging in electron microscopy / |c Thomas Vogt, Wolfgang Dahmen, Peter Binev, editors. |
| 260 | |a New York : |b Springer, |c c2012. | ||
| 300 | |a 1 online resource (ix, 182 p.) : |b ill. | ||
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| 490 | 1 | |a Nanostructure science and technology, |x 1571-5744 | |
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Scanning transmission electron microscopy |x Simulation methods. | |
| 650 | 0 | |a Image analysis. |0 http://id.loc.gov/authorities/subjects/sh98002813 | |
| 653 | 4 | |a Analytical biochemistry. | |
| 653 | 4 | |a Chemistry. | |
| 653 | 4 | |a Nanotechnology. | |
| 653 | 4 | |a Surfaces (Physics). | |
| 653 | 4 | |a Materials Science. | |
| 653 | 4 | |a Characterization and Evaluation of Materials. | |
| 653 | 4 | |a Analytical Chemistry. | |
| 653 | 4 | |a Theoretical and Computational Chemistry. | |
| 653 | 4 | |a Measurement Science and Instrumentation. | |
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| 700 | 1 | |a Dahmen, Wolfgang, |d 1949- |0 http://id.loc.gov/authorities/names/n89126157 |1 http://viaf.org/viaf/27134168 | |
| 700 | 1 | |a Binev, Peter. |0 http://id.loc.gov/authorities/names/nb2012022052 |1 http://viaf.org/viaf/266548631 | |
| 830 | 0 | |a Nanostructure science and technology. |0 http://id.loc.gov/authorities/names/n2002159859 | |
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