Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /

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Bibliographic Details
Meeting name:International Symposium on Electron Beam Ion Sources and Traps and their Applications (8th : 2000 : Upton, N.Y.)
Imprint:Melville, N.Y. : American Institute of Physics, 2001.
Description:xiv, 304 pages : illustrations ; 25 cm.
Language:English
Series:AIP conference proceedings, 0094-243X ; v. 572
AIP conference proceedings ; no. 572.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11321525
Hidden Bibliographic Details
Other authors / contributors:Prelec, Krsto.
ISBN:0735400113
9780735400115
Notes:Includes bibliographical references and index.
Access is restricted to subscribing institutions.
Also available in print.
Other form:Original 0735400113

MARC

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