Focused ion beams for analysis and processing : November 27 - December 1, 2006, Boston, Massachusetts, USA.

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Bibliographic Details
Imprint:Warrendale, PA : Materials Research Society, c2006.
Description:106 p. : ill. ; 24 cm.
Language:English
Series:Materials Research Society symposium proceedings ; v. 983
Materials Research Society symposia proceedings ; v. 983.
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/6696232
Hidden Bibliographic Details
Other authors / contributors:Materials Research Society. Meeting (2006 : Boston, Mass.)
ISBN:9781604234305
160423430X
Notes:"Fall 2006."
Includes bibliographical references and index.
Description
Item Description:"Fall 2006."
Physical Description:106 p. : ill. ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9781604234305
160423430X